晶圓級探針卡簡介 密度、高精度的垂直式探針卡（Vertical Probe Card），使得高單價的精密探針卡藉由製程的改. 變因而降低其價格。 一、前言. 晶圓針測技術隨著半導體製程技術一.
微垂直探針卡之設計與製作 - 自動控制工程學系 - 逢甲大學 為了達到探針卡電極間的微小間距這目的，可以透過矽的批次製造技術製作 ... In order to achieve the fine pitch between the pads in the probe cards, there have.
旺矽科技股份有限公司-Probe Card Probe Card Cantilever Type | Vertical Type Probe Card for Multi-DUT Multi-DUT probe card for Memory devices. Design and manufacturing capability up to 32 DUT. Probe Card for LCD Driver TCP (Dual DUT) Double your through put by new released dual-site TCP .
旺矽科技股份有限公司-Probe Card Probe Card Cantilever Type | Vertical Type Probe Head Probe Head can be ordered individually and compatible with your existing space transformer. MLO\MLC Type VPC Vertical probe for solder bump devices, contact with area array pads layout. Multi-Layer
STAr Technologies Memory IC Vertical Probe Card STAr's Aries-Zenith MIP is a new vertical probe card technology for testing memory ICs. Aries-Zenith MIP enables high parallelism memory IC tests at pitch down to 70um and also wafer-level burn-in tests from -40 degC to 200 .
Vertical Probe Card - 相關圖片搜尋結果
Welcome to sv probe [ put us to the test ] ::::::::: SV Probe's Trio is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application. SV’s Trio probe card ensures h
Probe Of Vertical Probe Card - FreshPatents.com: Updated Patent Lists & Free Tools A probe of a vertical probe card is disclosed. The probe has a probe tip and a surface region extended from the probe tip about 1-10 mil. The surface region is coated with a nano-film of high electro-conductive nano-material, and the thickness of the nano
Products - Vertical Probe Card - Spire Manufacturing Inc. : Probe Cards, Load Boards, Final Tes Vertical Probe Card Spire Manufacturing is proud to introduce our high-quality, vertical probing solution to wafer testing for memory, microprocessors, and logic devices. With our vertical technology, our customers can increase test yields while reducing
System-on-Chip | FormFactor roadmap requirements for performance and geometry shrinks. FormFactor delivers a suite of advanced MEMS, vertical and cantilever probe cards. Vx-MP Learn More Apollo Learn More QiLin Learn More TrueScale Learn More Learn More ...
