Point defects in sputtered NiO films - Scitation - American Institute of ... 10 Feb 2009 ... The dominant point defects in p -type NiO films were determined by analyzing the coordination number (CN) change with various annealing ...
Point defects in sputtered NiO films - Scitation - American Institute of ... 10 Feb 2009 ... The dominant point defects in p-type NiO films were determined by analyzing ... the nonstoichiometry of sputtered NiO film is determined by the ...
Point defects in sputtered NiO films The dominant point defects in -type NiO films were determined by analyzing the ... The results show that the nonstoichiometry of sputtered NiO film is determined ...
Point defects in sputtered NiO films The dominant point defects in p-type NiO films were determined by analyzing the ... the nonstoichiometry of sputtered NiO film is determined by the number of ...
Point defects in sputtered NiO films - ResearchGate ABSTRACT The dominant point defects in p-type NiO films were determined by analyzing the coordination number (CN) change with various annealing ...
Point defects in sputtered NiO films - ResearchGate 10 Feb 2009 ... Point defects in sputtered NiO films. Wei-Luen Jang,1 Yang-Ming Lu,2 Weng- Sing Hwang,1,a) Tung-Li Hsiung,3 and. H. Paul Wang3.
Point defects in sputtered NiO films - IEEE Xplore 10 Feb 2009 ... The dominant point defects in p-type NiO films were determined by analyzing ... the nonstoichiometry of sputtered NiO film is determined by the ...
IEEE Xplore Abstract - Point defects in sputtered NiO films 18 Jun 2009 ... The dominant point defects in p -type NiO films were determined by analyzing the coordination number (CN) change with various annealing ...
IEEE Xplore Abstract (Authors) - Point defects in sputtered NiO films IEEE Xplore. Delivering full text access to the world's highest quality technical literature in engineering and technology.
Point defects in sputtered NiO films | DeepDyve The dominant point defects in p-type NiO films were determined by analyzing the ... the nonstoichiometry of sputtered NiO film is determined by the number of ...