Point defects in sputtered NiO films - 成功大學myweb個人網頁空間服務說明 Point defects in sputtered NiO films Wei-Luen Jang,1 Yang-Ming Lu,2 Weng-Sing Hwang,1,a Tung-Li Hsiung,3 ...
Point defects in sputtered NiO films The dominant point defects in p -type NiO films were determined by analyzing the coordination number (CN) ... The results show that the nonstoichiometry of sputtered NiO film is determined by the number of nickel atoms rather than by the number of oxygen
The Role of Defects in Functional Oxide Nanostructures - Springer Jang, W.-L., et al.: Point defects in sputtered NiO films. Appl. Phys. Lett. 94, 062103 (2009) Biju, V., Khadar, M.A.: AC conductivity of nanostructured nickel oxide. J. Mater. Sci. 36, 5779–5787 (2001) Hasiguti, R.R., Yagi, E.: Electrical conductivity be
Point defects and texture of Pd1 − xInx sputtered intermetallic thin films Pd1 − xInx thin films (0.4 < x < 0.56) were prepared by radio frequency sputtering from a multi-zone target. The properties of these Hume-Rothery alloys were ... ScienceDirect features may not work properly in your current browser version. For the best pr
Effect of substrate temperature on the electrically conductive stability of sputtered NiO films From the results described above, it can be found that the increase in substrate temperature provides more energy for deposited atoms to arrange to their equilibrium positions, the excess point defect such as nickel vacancy will be reduced. Thus the atomi
Characterization of sputtered NiO thin films ties of NiO films, such as the crystalline structure, resistivity, transmittance and electrical stability were all investigated. It ... structure change and point defects as well. 3.4. Electrical stability in natural aging test It is found that the electr
Influence of Growth Temperature on the Properties of DC Reactive Magnetron Sputtered NiO Thin Films point defects and dislocations in the films are modified by applying different substrate temperatures. To the best of our knowledge, the effect of Ts on the properties of NiO thin films using magnetron sputtering is still not well studied. ...
Growth and Electronic Properties of Sputtered Ni–NiO Films as a Potential Resistive Memory Jang et al. Growth and Electronic Properties of Sputtered Ni–NiO Films as a Potential Resistive Memory ARTICLE flowrate2.0sccmpromotestheaccumulationofsputtered atoms. TableIalsoshowstheresistivityofthefilms,asdeter-mined by four-point measurement. The ...
Growth and Electronic Properties of Sputtered Ni–NiO Films ...: ingentaconnect NiO films were deposited by radio-frequency reactive magnetron sputtering from a Ni target in an Ar–O 2 mixed atmosphere. ... The formation of defects, change in preferential orientation, and electrical conduction properties of the deposited films were ex
Growth and electronic properties of sputtered Ni-NiO films as a potential resistive memory - Researc Publication » Growth and electronic properties of sputtered Ni-NiO films as a potential resistive memory. ... Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a ro
